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Revert "Kill unit tests that run more than 1200 seconds"

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This reverts commit 3d5c7cd46c which
added wrapper around all the unit tests that would run the unit test in
the forked process.

This makes any debugging of the unit tests too hard.  Futures attempts
to fix #3980 should add a custom automake test harness (log driver) that
would kill the unit test after configured timeout.
This commit is contained in:
Ondřej Surý 2023-04-14 06:14:19 +02:00
parent 22fb1b115a
commit c60ce13127
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GPG key ID: 2820F37E873DEA41
1 changed files with 14 additions and 38 deletions
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52
tests/include/tests/isc.h
View file

@ -17,9 +17,6 @@
#include <inttypes.h>
#include <stdbool.h>
#include <sys/types.h>
#include <sys/wait.h>
#include <unistd.h>
#include <isc/buffer.h>
#include <isc/hash.h>
@ -169,39 +166,18 @@ teardown_managers(void **state);
#define ISC_TEST_MAIN ISC_TEST_MAIN_CUSTOM(NULL, NULL)
#define ISC_TEST_MAIN_CUSTOM(setup, teardown) \
static int __child = 0; \
static void __alarm(int sig ISC_ATTR_UNUSED) { \
kill(__child, SIGABRT); \
} \
int main(void) { \
int r, status; \
\
switch ((__child = fork())) { \
case 0: \
break; \
case -1: \
exit(1); \
default: \
signal(SIGALRM, __alarm); \
alarm(1200); \
if ((r = waitpid(__child, &status, 0)) == __child) { \
/* Pass the exit status to the caller. */ \
if (WIFEXITED(status)) { \
exit(WEXITSTATUS(status)); \
} \
} \
exit(1); \
} \
\
signal(SIGPIPE, SIG_IGN); \
\
isc_mem_debugging |= ISC_MEM_DEBUGRECORD; \
isc_mem_create(&mctx); \
\
r = cmocka_run_group_tests(tests, setup, teardown); \
\
isc_mem_destroy(&mctx); \
\
return (r); \
#define ISC_TEST_MAIN_CUSTOM(setup, teardown) \
int main(void) { \
int r; \
\
signal(SIGPIPE, SIG_IGN); \
\
isc_mem_debugging |= ISC_MEM_DEBUGRECORD; \
isc_mem_create(&mctx); \
\
r = cmocka_run_group_tests(tests, setup, teardown); \
\
isc_mem_destroy(&mctx); \
\
return (r); \
}